The chemical and crystallographic mapping of materials with nanometer resolution, for example, is made with light focused in nanometric regions of the samples with Synchrotron Radiation. The intensity of the illumination, which defines the quality of the mapping, is proportional to the illuminated area and the brightness of the source. Therefore, to reduce the illuminated area and see finer details, maintaining the image quality, high brightness is required.
Similarly, to make three-dimensional images of materials with better contrast and temporal resolution, some beamlines use only a part of the beam which is transversely coherent (i.e., similar to a laser). This fraction is proportional to the brightness of the source and the square of the wavelength. Thus, to obtain an intense coherent illumination with X-rays (shorter wavelength) a high brightness is required.
The low brightness of the current Synchrotron Light Source UVX prevents today in Brazil, for example, beamlines with micro- and nanofocus and coherent diffraction imaging beamlines that are important for the development of the biotechnology and nanotechnology areas. This also prevents the community of academic and industrial users of the LNLS to perform highly complex experiments in areas such as archeology and paleontology, through medicine, biology and agriculture, or even in areas where the synchrotron is traditionally used such as physics, chemistry and materials science.
The new Synchrotron Light Source will not only be able to quantitatively improve the experiments that are already made today. Sirius and its Beamlines will enable primarily a qualitative change to the user research, allowing the execution of these experiments now impossible in the Country.