Laboratório Nacional
de Luz Síncrotron

English

IR1

VOLTAR

SOBRE A LINHA DE LUZ


The IR1 beamline is an experimental station dedicated to Synchrotron Fourier Transform Infrared (FTIR) Nanospectroscopy in the mid-infrared range. Its main purpose is the chemical-physical analysis of condensed matter in the nanoscale. Similar to a typical FTIR endstation but with spatial resolution better than 40 nm, IR1 has multidisciplinary demands including investigations in chemistry, physics, biology, archaeology, pharmacology and materials science. The available techniques are scattering Scanning Near-field Optical Microscopy (s-SNOM) and tapping-mode Atomic Force Microscopy (AFM).

 

For beating the intrinsic diffraction limit of light, the synchrotron broadband IR beam is focused on a metallic AFM tip, which acts as an antenna. The radiation is then condensed at the apex of the tip, which has typical radius of 25 nm. Hence, the source size is no longer dependent on the wavelength of the radiation but on the dimensions of the tip – in this case few tens of nanometers.

 

In this scenario, the AFM combined with the IR beam becomes a spectral nanoprobe with spatial resolution better than 40 nm, which can be suitable for multidisciplinary scientific cases in chemistry, physics, biology, archaeology, pharmacology and materials science. Applications include: opto-electronic and vibrational properties of 2D materials, nanoscale chemical analysis of polymers blends, drug delivery efficiency in the sub-micron scale, opto-vibrational properties of solid-state nano-devices and nano-correlation between morphology and chemical composition of infrared active condensed matter.

CONTATO


Email da Linha de Luz: N/A

Telefone da Linha de Luz: +55 19 3517 5157

 

Coordenador da Linha de Luz: Raul Freitas

Email do Coordenador: raul.freitas@lnls.br

Telefone do Coordenador: +55 19 3715 5060

Para mais informações sobre a equipe da Linha de Luz, confira a página da equipe aqui

LAYOUT


ELEMENTOS ÓTICOS

Elemento Tipo Posição[m] Descrição
SOURCEBending MagnetBending Magnet D03 exit A (4°), 1.67 T, 30 mrad x 80 mrad
M1Plane, 6 mm slot 2.5Gold coated, aluminum substrate
M2Tangential cone-shaped3.1Gold coated, aluminum substrate
M3Tangential cylinder3.7Gold coated, aluminum substrate
CVDDiamond window7.020 mm diameter by 500  \mu \rm m diamond window by Chemical Vapor Deposition
M4Tangential cylinder7.5Gold coated, aluminum substrate
M5Tangential cylinder7.9Gold coated, aluminum substrate

PARÂMETROS

Parâmetro Valor Obs. | Condição
Energy range [  \rm cm^{-1} ]3000 - 700Broadband radiation limited by beamsplitter transmission and detector sensitivity
Energy resolution [  \rm cm^{-1} ]Up to 3.3Limitted by the interferometer travel
Beam size at sample [nm, FWHM]< 40 nmNear-field spot defined by the size of the s-SNOM tip
Flux at first optical element [Phot/s/0.1%bw] 2.0 \times 10^{13}at 1000  \rm cm^{-1} (10  \mu \rm m)
AFM scanning stage (maximum travel) [  \mu \rm m ] \pm45-
AFM scanning stage minimum step [nm]5-

INSTRUMENTAÇÃO

Instrumento Tipo Modelo Especificações Fabricante
MCT DetectorSingle element Mercury-Cadmium-Telluride (MCT) KLD-0.1-J1208L750  \rm cm^{-1} to 3000  \rm cm^{-1}, 100  \mu \rm m element size, DC to 1 MHz BW,  \rm LN_{2} cooledKolmar Technologies
MCT DetectorSingle element MCTIRA-20-00103650  \rm cm^{-1} to 3000  \rm cm^{-1}, 50  \mu \rm m element size, 500 Hz to 2 MHz BW,  \rm LN_{2} cooledInfrared Associates Inc.
Si DetectorSingle element Silicon detectorPDA36A-EC350 nm to 1100 nm, 3.6 mm x 3.6 mm element size, DC to 10 MHz BW , air cooledThorlabs
InGaAs Detector Single element Indium-Gallium-Arsenide (InGaAs) detector PDA10D-EC PDA10D-EC Thorlabs
Lock-in amplifier2 input channels digital lock-in amplifier HF2LIDC to 50 MHz, 210 MSa/s, USB 2.0 high-speed, 480 Mbit/sZurich Instruments
Visible laserHeNe laserHNL150L15 mW HeNe (633 nm) laserThorlabs

CONTROLE E AQUISIÇÃO DE DADOS

 

Data acquisition is done directly from the native software of the NeaSnom microscope developed by NeaSpec. Mathematica® scripts developed by the beamline staff are available for users during beamtime.

REQUISIÇÃO DE TEMPO DE FEIXE

 

Chamados de submissão de propostas são abertos usualmente duas vezes ao ano, um para cada semestre. Todas as propostas de pesquisa acadêmica precisam ser submetidas eletronicamente através do portal SAU Online. Saiba mais sobre o processo de submissão de propostas aqui.

 

Sample requirements: Samples should be essentially compatible with AFM tapping (semi-contact) mode technique. Therefore, samples should be a solid block (not a powder) with maximum roughness of c.a. 200 nm. Especially for organic materials, the samples should be thin films (50 nm to 300 nm) deposited on an IR flat and highly reflective substrate (Si or Au). In this last case, the signal-to-noise ratio can be improved by the enhancement from the substrate. For samples on gold substrates, we kindly ask to the users to bring an original clean substrate for measuring the reference spectrum. Sample should not be larger than 15 mm by 15 mm by 5 mm (width, depth and height). It is highly recommend that the samples should be characterized with conventional FTIR (\mu-FTIR or ATR) prior to the nanospectroscopy experiment.

FOTOS

IR1: s-SNOM



Português:
Microscópio s-SNOM e óptica de incidência da Linha de Luz IR1.

English:
s-SNOM microscope and incidence optics of the IR1 beamline.

IR1: Estação Experimental / Experimental Station



Português:
Estação experimental de nanoespectroscopia no Infravermelho.

English:
IR nanospectrocopy experimental station.

IR1: Mesas de Controle / Control Desks



Português:
Mesas de controle experimental da linha de luz e estações de trabalho para processamento de dados para usuários.

English:
Beamline experiment control desks and data processing workstations for users.

IR1: Bancada / Workbench



Português:
Bancada para preparação de amostras para usuários da Linha de Luz IR1.

English:
Sample preparation bench for users of the IR1 beamline.