SCATTERING SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM)
scattering Scanning Near-Field Optical Microscopy (s-SNOM) is a nanoscopy technique which combines Atomic Force Microscopy (AFM) and optics for producing a tip-enhanced optical or infrared (IR) probe with spatial resolution beyond the diffraction limit of light. In the case of the IR1 beamline, the broadband synchrotron IR beam is focused on a metallic AFM tip (nano-antenna) generating a broadband source smaller than 40 nm. The interaction of the IR nano-source with the sample surface yields broadband images (scanning mode) or 40 nm pixel point spectrum.
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