Laboratório Nacional
de Luz Síncrotron

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IR1

VOLTAR

TÉCNICAS DISPONÍVEIS


 

A linha IR1 é exclusivamente dedicada à técnica de Microscopia Óptica de Campo Próximo do tipo Espalhamento (s-SNOM) a qual associa microscopia de infravermelho (µ-FTIR) e microscopia de força atômica (AFM). Para saber mais sobre as limitações e requerimentos das técnicas, contate o coordenador da linha de luz antes de submeter sua proposta.

 

SCATTERING SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM)


scattering Scanning Near-Field Optical Microscopy (s-SNOM) is a nanoscopy technique which combines Atomic Force Microscopy (AFM) and optics for producing a tip-enhanced optical or infrared (IR) probe with spatial resolution beyond the diffraction limit of light. In the case of the IR1 beamline, the broadband synchrotron IR beam is focused on a metallic AFM tip (nano-antenna) generating a broadband source smaller than 40 nm. The interaction of the IR nano-source with the sample surface yields broadband images (scanning mode) or 40 nm pixel point spectrum.

 

Recent publications:

B. Pollard et al. (2016). Infrared Vibrational Nanospectroscopy by Self-Referenced Interferometry. Nano Letters, vol. 16, 55–61. doi: 10.1021/acs.nanolett.5b02730

 

I. Barcelos et al. (2015). Graphene/h-BN Plasmon-phonon coupling and plasmon delocalization observed by infrared nano-spectroscopy. Nanoscale, vol.7, 11620–11625. doi: 10.1039/C5NR01056J

 

T. Moreno et al. (2013). Optical layouts for large infrared beamline opening angles. Journal of Physics: Conference Series, 425(14), 142003. doi:10.1088/1742-6596/425/14/142003