The Teiú¹ (TEnder X-Ray Spectromicroscopy for In-sitU Experiments) beamline will be dedicated to transmission and scattering X-ray microscopy (XRM), exploring photoabsorption (XAS), fluorescence (XRF), luminescence (XEOL), and diffraction (XRD) techniques in varied environmental conditions and aimed at in situ and operando studies. The beamline will cover the 1 to 10 keV range with submicrometric and achromatic focus and will be dedicated to understanding structural, morphological, and chemical dynamics in heterogeneous and multielement compounds. The beamline operates in the intermediate energy X-ray range, covering the absorption edges of chemical elements ranging from silicon, phosphorus, sulfur, and potassium to manganese, iron, nickel, and copper, of extreme relevance in soil fertilization and plant and seed nutrition, as well as in the area of ​​polymers and hybrid compounds, also allowing the understanding of issues related to environmental pollution and contamination.

¹The Teiú beamline is part of the second phase of the Sirius project, which was included in the Growth Acceleration Program (Novo PAC) and will be funded by resources from the FNDCT/MCTI. The plan announced by the Federal Government foresees investments of R$ 800 million over the next four years for the second phase of the Sirius project. This includes the design and construction of ten new research stations, including technical and building infrastructure, in addition to the continuous optimization of electron accelerators. Learn more.